Evident - Olympus High End Industrial Microscopes
Evident - Olympus provides users with routine and research microscopes, as well as high-tech systems.
With the LEXT industrial confocal microscope equipped with a laser light source, you can perform measurements with nanometer precision; easily conducting operations such as surface roughness measurement, depth measurement, and thin film coating thickness measurement.
With its ability to use two objectives simultaneously and its 90-degree tilt capability, the DSX2000 digital microscope boasts superior and unique features in its class, allowing you to perform both macro and micro studies with a single device.
With the CIX100 technical cleaning microscope, you can perform technical cleaning analyses according to many world standards such as ISO 16232, VDA 19, and ISO 4407, and prepare customized reports along with particle images.
DSX2000 Opto-Digital 3D Microscope
Advanced Automation, Superior Image Quality.
The DSX2000 digital microscope, the newest member of the DSX series, provides maximum efficiency in industrial analysis with its advanced motorized features, high-resolution optical system, and user-friendly interface.
With a wide range of applications from production lines to research laboratories, the DSX2000 combines high speed, accuracy, and ease of use in quality control and material analysis processes. Its intelligent automation infrastructure and ergonomic design improve user experience while ensuring reliable and repeatable results in any environment.
Fully automatic operation with motorized zoom and motorized lens change.
Seamless imaging from macro to micro with a magnification range of 20.9x – 7,307x.
Seven different observation methods (BF, OBQ, DF, MIX, POL, DIC and SR) with a single button press.
AI-powered image enhancement and autofocus
Clear and accurate measurements thanks to high-resolution lenses.
PRECiV DSX software enables 2D/3D measurement, reporting, and data management.
Next-Generation Motorized Head: Seamless Magnification with 4 Objectives Simultaneously
Thanks to its motorized body and four-lens motorized head, the DSX2000 automatically handles lens changes and focusing. It offers fast, repeatable, and efficient observation across the entire magnification range without user intervention.
Realistic Surface Imaging
The new SR (Shaded Relief) imaging method presents surface topography with a three-dimensional sense of depth through shading. It highlights texture and detail on metal, optical, semiconductor, and electronic surfaces, enabling fast and reliable analysis for manufacturing control and R&D processes.
Advanced 3D Imaging: EFI/3D, Panorama, and Intelligent Shading
EFI/3D and Panorama modes create high-resolution, single-piece 2D/3D images of samples of varying sizes. Large areas and micro-details are examined seamlessly, while Intelligent Shading Correction automatically compensates for light and shadow differences; preventing loss of contrast and detail in combined images, ensuring fast and reliable analysis.
Software Infrastructure That Increases Productivity
PRECiV DSX software integrates fully with DSX2000, offering imaging, measurement, and reporting on a single platform. AI-powered image processing automatically optimizes contrast and clarity; 2D measurements such as distance and area, as well as 3D measurements such as depth and volume, and surface roughness parameters Ra, Rz, and Sa are reliably calculated. The software supports metallographic analyses according to ASTM and ISO standards, ensuring traceability and comparability of results.
LEXT™ OLS5500 Hybrid 3D Confocal and Optical Profilometer
Limitless Surfaces, Reliable Results
The award-winning LEXT™ OLS5500 hybrid 3D confocal and optical profilometer system combines Laser Scanning Confocal Microscope (LSCM), White Light Interferometry (WLI), and Focus Variation Microscopy (FVM) technologies in a single platform. Designed for R&D and quality control teams, as well as university central laboratories, the system precisely measures surface details, providing verifiable and traceable results.
3-in-1 System: The combination of LSCM, WLI, and FVM provides up to 40 times faster data acquisition compared to traditional LSCM systems.
Guaranteed Accuracy: As the world's first and only 3D optical profilometer for both LSCM and WLI measurements, it offers high accuracy and repeatability.
LSCM: Provides superior horizontal resolution on microstructures, rough textures, and steeply inclined surfaces.
WLI: Offers nanometer-level vertical precision on flat, curved, or thin films.
FVM: Provides comprehensive measurements from macro to micro in large or irregular areas.
4K High Sensitivity: Provides clear images even on fine structures, low-contrast surfaces, or transparent areas.
Laser DIC & Color DIC: High-clarity images of surface topography and material boundaries.
Top-Surface Detection: Eliminates noise effects from the underlying layer, isolating the actual surface and ensuring the most accurate results.
Intelligent Workflow, Maximum Productivity
OLS5500's intelligent automation and workflow tools make surface analysis easy and fast for all user levels. It increases your analysis efficiency and production speed by providing accurate and repeatable results the first time in LSCM, WLI, and FVM.
Continuous Observation: Automatically creates a macro map during table movement, monitoring and documenting all areas. Thanks to the "Continuous Autofocus" feature, manual refocusing is not required.
Intelligent Automation: Automates critical measurement processes, focusing the user on analysis rather than adjustments. With SmartScan II, simply place the sample, press the start button, and the system will perform all measurements.
PEAK Algorithm: Provides highly accurate data from low to high magnifications and reduces data acquisition time. When measuring the shape of steps/steps on a sample, data acquisition time can be reduced by skipping unnecessary scan intervals in the Z direction.
Reliable Metrology in Compliance with ISO 25178 and International Standards
The OLS5500 system calculates critical metrology parameters such as 3D topographic measurements, volume analysis, profile measurement, and surface roughness with high accuracy, in accordance with ISO 25178, ASTM, JIS, and other international standards. All reports are traceable, repeatable, and easily integrated into quality systems.
Comprehensive Analysis and Reporting
LEXT OLS5500 advanced image analysis software supports various analysis methods including 2D and 3D measurements, step/depth measurement, distance measurement, area and volume measurement, histogram, automatic edge measurement, automatic particle analysis, thin film thickness measurement, and CAD data output. It also integrates with PRECiV software to enable metallographic measurement and analysis.
CIX100 Technical Cleaning Analysis Microscope
Customized Solution for Technical Cleaning Analysis
Evident – Olympus’s expertise in imaging and metrology systems – provides today’s manufacturers with customized solutions for particle counting, sizing, and classification. Measuring particle size and distribution is crucial because it can directly affect the performance, lifespan, and reliability of many manufactured products.
Simplify your technical cleaning analyses.
Offering a turnkey solution, the Evident - Olympus CIX100 cleaning analysis system is designed to meet the cleaning requirements of modern industry, as well as national and international standards. The cleanliness of machine parts, manufactured products, or liquids is central to the production process. Introducing the CIX100 system for counting, analyzing, and classifying micron-sized contaminants and foreign particles.
Get simple and reliable results.
Experience intuitive guidance for maximum efficiency.
Review all analysis data in one place.
Develop flexible solutions for evaluation and revision.
Create a comprehensive and standards-compliant report.
View all relevant data in one place.
The Evident - Olympus CIX100 system, thanks to its patented polarization method, provides high-performance imaging of both metallic and non-metallic contaminants (up to 2.5 μm particles) in a single scan and offers live analysis capabilities. This all-in-one scanning solution allows analyses to be completed twice as fast as the classic method (Inspector series). The counted and classified particles are visualized live and simultaneously separated into size classes during scanning, supporting direct decision-making and helping to ensure a quick response time in case of a failed test. The system classifies particles according to international standards and automatically displays images of large particles on a single screen, adding them to the report.
International Standards and Reporting
You can prepare your reports according to all major international standards used in the automotive and aerospace industries, including the following. You can also create company-specific standards and report formats using the standard creation menu and report customization options.
ASTM E1216-11:2016 / ISO 4406:2021 / ISO 4407:1999 / ISO 4407:2002 / ISO 11218:1993 / ISO 12345:2013 / ISO 14952:2003 / ISO 16232-10:2007 / ISO 16232:2018 / ISO 21018:2008 / DIN 51455:2015 / NAS 1638:1964 / SAE AS4059:2011 / VDA 19.1:2015 / VDA 19.2:2015