The Agilent 5100 Synchronized Dual View (SVDV) ICP-OES is the first in its field for ICP-OES analysis. With Dichroic Spectral Combiner (DSC) technology, it can capture axial and radial plasma images in a single measure. When the 5100 ICP-OES is combined with a vertical torch and a high speed, zero gas consumption Vista Chip II CCD detector, you can approximate even your most demanding samples using 50% less argan. Processes 55% faster.